Short-Term Test Procedure Details
The short-term test procedure involved a two-step process. The first step was to establish a "pseudo-baseline" light output that equated relatively to the manufacturer's rated light output under IESNA LM-66 testing (conducted at 25°C ± 1°C (77°F ± 2°F) (IESNA 1991a). The second step was to simulate the insulated ceiling environment by adding insulation. The relative light output measured from pre- and post-insulation conditions determined the thermal factor, expressed as a percentage. The short-term test procedure follows:
- Install the lamp in the apparatus within an ICAT recessed downlight housing, such that the end of the lamp intersects the plane of the aperture.
- Apply power to the lamp. Record power readings.
- Allow the system to reach steady-state illuminance.
- Record photometer measurements.
- Remove power from the fixture.
- Immerse the luminaire in 12" (measured from the base of the apparatus) with loose fill cellulose insulation.
- With the lid closed, apply power to the luminaire.
- Begin automatic temperature recording.
- At six hours of operation, record photometer measurements. Record power readings.
- Test completed.
The data collected in the short-term test were used to further evaluate the products against the PNNL performance criteria. The thermal factor was applied to the manufacturer rated light output (measured at 25°C) to verify the product met the minimum requirement of 500 delivered lumens requirement in an insulated ceiling environment. The highest recorded ambient lamp temperature was compared to the manufacturer certified maximum warranted operating temperature. The measured temperature of the electrolytic capacitor(s) was compared to the temperature rating of the capacitor manufacturer. Eight products that successfully completed the short-term test were moved into elevated temperature life testing.