March 15, 2021
Journal Article

Metastable orientation relationships in thin film Cu-Cr bilayers

Abstract

Metastable orientation relationships (ORs) between Cu and Cr were kinetically stabilized via epitaxial thin film deposition on MgO(001). Both Cu(001) and Cr(001) grow epitaxially on MgO(001). The Bain OR was observed by x-ray diffraction and scanning transmission electron microscopy for Cr(001) / Cu(001) / MgO(001). In contrast, three Cr/Cu ORs were found for Cr deposition on Cu(001) / MgO(001): the Pitsch OR, and two previously unreported ORs related to the Bain and Pitsch ORs, respectively. Ab initio calculations predict the energetics of these ORs, and reveal that the deformation resistance of Cr leads to the three observed ORs on Cu(001).

Revised: December 8, 2020 | Published: March 15, 2021

Citation

Kaspar T.C., Q. Pang, P.V. Sushko, M.E. Bowden, J. Tao, B. Gwalani, and M.J. Olszta, et al. 2021. Metastable orientation relationships in thin film Cu-Cr bilayers. Scripta Materialia 194. PNNL-SA-156813. doi:10.1016/j.scriptamat.2020.113635

Research topics