Measures Ru 3d, 4P and O 1s high-resolution core-level XPS spectra, along with Ru 3d and O1s scanned-angle x-ray photoelectron diffraction angular distributions for RuO2(110). XPS interpretation and nature of the scans suggest that the complex line shapes are due to final-state effects, rather than the presence of Ru in oxidation states other than +4.
Revised: May 17, 2019 |
Published: June 1, 1997
Citation
Kim Y.J., Y. Gao, and S.A. Chambers. 1997.Core-Level X-ray Photoelectron Spectra and X-ray Photoelectron Diffraction of RuO2(110) Grown by Molecular Beam Epitaxy on TiO2(110).Applied Surface Science 120, no. 3-4:250-260.PNNL-SA-28296.doi:10.1016/S0169-4332(97)00233-X