FEBRUARY 15, 2024 Conference Paper Efficient QAOA Optimization using Directed Restarts and Graph Lookup ( Read More )
FEBRUARY 15, 2024 Journal Article Development and Testing of a Fission-like Neutron Field for Dosimetry and Instrument Calibrations based on Deuterium-Tritium Generator ( Read More )
FEBRUARY 15, 2024 Conference Paper Development of Advanced Radionuclide Gamma spectrOmeter-2 (ARGO-2) for Low-level Radionuclide Measurements ( Read More )
FEBRUARY 15, 2024 Conference Paper Q-BEEP: Quantum Bayesian Error Mitigation Employing Poisson Modeling over the Hamming Spectrum ( Read More )
NOVEMBER 9, 2023 Journal Article EPR-BASED UNCERTAINTY VALIDATION OF THE CALCULATED EXTERNAL DOSES FOR POPULATION EXPOSED IN THE URALS REGION ( Read More )
NOVEMBER 8, 2023 Report Inventory of Public Key Cryptography in US Electric Vehicle Charging ( Read More )
OCTOBER 27, 2023 Journal Article Increased Crystal Field Drives Intermediate Coupling and Minimizes Decoherence in Tetravalent Praseodymium Qubits ( Read More )
OCTOBER 12, 2023 Journal Article Characterization of the Fast-Neutron Irradiator and the Fast-Flux Tube Irradiation Fixtures at the Pennsylvania State Breazeale Reactor ( Read More )
SEPTEMBER 1, 2023 Journal Article G4CMP: Condensed Matter Physics Simulation Using the Geant4 Toolkit ( Read More )
JULY 14, 2023 Conference Paper Radiation Damage Studies on Titanium Alloys as High Intensity Proton Accelerator Beam Window Materials ( Read More )
JULY 12, 2023 Journal Article Optimized Quantum Phase Estimation for Simulating Electronic States in Various Energy Regimes ( Read More )
JUNE 29, 2023 Report A Fission-like Neutron Spectrum Shaping Assembly based on D-T Generator ( Read More )
JUNE 22, 2023 Journal Article Exploring Parameter Redundancy in the Unitary Coupled-Cluster Ansatze for Hybrid Variational Quantum Computing ( Read More )
JUNE 11, 2023 Journal Article Development and Performance Evaluation of a Novel y-y Coincidence Analysis Software ( Read More )
MAY 26, 2023 Journal Article A Bayesian Approach for Characterizing and Mitigating Gate and Measurement Errors ( Read More )